Our Design for Testability (DFT) services ensure that semiconductor designs are test-ready, reliable, and manufacturable. We help clients achieve high fault coverage, reduced test cost, and faster yield ramp-up.
From scan insertion and ATPG to MBIST and boundary scan, our engineers implement industry-proven DFT methodologies across the complete silicon lifecycle.
Full-scan, partial-scan, and low-power scan architecture implementation to enable efficient structural testing.
Generation of high-quality ATPG patterns for stuck-at and transition faults with optimized test coverage.
DFT rule checks, simulation, and debug to ensure correct scan insertion and test readiness before tape-out.
DFT REQUIREMENT ANALYSIS
Understanding fault models, coverage targets, test constraints, and manufacturing requirements.
DFT ARCHITECTURE & INSERTION
Scan insertion, compression logic, clock control, and low-power DFT implementation.
ATPG & VALIDATION
ATPG pattern generation, simulation, coverage analysis, and test debug.
DFT SIGNOFF & SUPPORT
Final DFT signoff, documentation, and production support for manufacturing readiness.
